Current:
Atomic Force Microscopy(AFM)

Detailed Information

Experimental items: Dimension Icon AFM, enabling researchers to map and distinquish quanitatively between nanomechanical properties while simultaneously imaging sample topography at high resolution. the devoce operates over an extremely wide range (1MPa to 50GPA for modulus and 10pN to 10μn for adhesion) to characterize a large variety of sample types.


Experimental requirements:

X-Y   scan range

90μm×90μm   typical, 85μm minimum

Z   range

10μm   typical in imaging and force curve modes, 9.5μm minimum

Sample   size/holder

210mm   vacuum chuck for samples, ≤210mm diameter, ≤15mm thick

AFM   modes

ScanAsyst(air),   PeakForce Tapping(air), TappingMode (air), Contact Mode(air)


Imaging sample topography:


image.png            image.png


Charge standard: RMB 300 per h

Equipment Brand: BRUKER

Equipment location:

Key Lab of Bionic Engineering, Ministry of Education, Jilin University

Administrator: Hui Guo

Contact: 0431-85095575-313


Publish Institute

Key Lab of Bionic Engineering, Ministry of Education, Jilin University

Information Publisher

Hui Guo